Similar Products
You might also be interested in these products
Thickness Range 1nm – 150µm Wavelength Range 190-1700nm Simultaneous reflectance and transmittance Measure min/max and color.
Thickness Range 1nm – 250µm Wavelength Range 190-1700nm Reflection Thickness and refractive index general-purpose film thickness measurement instruments
The 4PP contact four-point probe configuration is recommended for thin metal and ion implant layers, and the non-contact Eddy Current (EC) probe is recommended for thicker metal layers and soft or flexible conductive surfaces
Thickness Range 4nm – 250µm Wavelength Range 190-1690nm Microscopic For spot size as small as 1 micron. Microscopes attaches to the C mount adapter Exact monitoring of the film thickness measurement spot. Thickness and index measured in less than a second