Nano-Observer AFM
Material characterization Polymer science Electrical characterizatio Semiconductor Soft sampl Biology
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ResiScope mode
Photovoltaic cells Semiconductors Coatings, oxydes, materials All conductive characterization
HD-KFM
One pass – NO LIFT : Very high sensitivity & higher spatial resolution Surface potential mapping 2nd lock-in amplifier Applications: Materials, semiconductors, batteries…
GALAXY DUAL controller
XY scan range 100 μm (tolerance +/- 10%) Z range 15 μm (tolerance +/- 10%) XY drive resolution 24 bit control – 0.06 Angströms Z drive resolution 24 bit control – 0.006 Angströms Ultra low noise HV Typ : <0.01 mV RMS 6 DAC Outputs 6 D/A Converters – 24 bit (XYZ drive, bias, aux…