Available Variations
Check out different versions of this product
Material characterization Polymer science Electrical characterizatio Semiconductor Soft sampl Biology
Photovoltaic cells Semiconductors Coatings, oxydes, materials All conductive characterization
One pass – NO LIFT : Very high sensitivity & higher spatial resolution Surface potential mapping 2nd lock-in amplifier Applications: Materials, semiconductors, batteries…
XY scan range 100 μm (tolerance +/- 10%) Z range 15 μm (tolerance +/- 10%) XY drive resolution 24 bit control – 0.06 Angströms Z drive resolution 24 bit control – 0.006 Angströms Ultra low noise HV Typ : <0.01 mV RMS 6 DAC Outputs 6 D/A Converters – 24 bit (XYZ drive, bias, aux…
Similar Products
You might also be interested in these products
3D Profilometer WLI and PSI Mode 50nm to 10mm and 0 to 3um Intuitive Analysis with Profilm3D Profilometer Software
4D Profilometer up to 100,000 fps sub nanometric vertical resolution
Elemental Analysis & Mapping Detection Range: B to U Energy Resolution: 125-135 eV Si(Li) or SDD Detector Quantitative & Qualitative Analysis
High Resolution Imaging Magnification: 10x to 300,000x Resolution: 1-3nm SE/BSE Detectors Variable Pressure/Low Vacuum Options