F30 Thickness Measurement Instrument Series
Thickness Range 3nm – 450µm Wavelength Range 190-1690nm Online Monitoring Thin-Film Deposition Measure deposition rates, film thickness optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time
Similar Products
You might also be interested in these products
Thickness Range 1nm – 150µm Wavelength Range 190-1700nm Simultaneous reflectance and transmittance Measure min/max and color.
Thickness Range 50nm – 70µm Wavelength Range 380-1050nm single and multiple layers Automobile Lighting Primer/hard coat
Thickness Range 1nm – 250µm Wavelength Range 190-1700nm Reflection Thickness and refractive index general-purpose film thickness measurement instruments
The 4PP contact four-point probe configuration is recommended for thin metal and ion implant layers, and the non-contact Eddy Current (EC) probe is recommended for thicker metal layers and soft or flexible conductive surfaces